John Armstrong has installed, maintained, and operated microprobes at NIST, Caltech, and Proctor & Gamble. He also has experience with several generations of analytical scanning electron microscopes, analytical scanning transmission electron microscopes, ion microprobes, x-ray diffraction and x-ray fluorescence equipment, and UHV field emission Auger electron and x-ray emission microprobes.
John has done extensive research in the development and application of quantitative procedures for electron microprobe analysis, and he enjoys teaching. John has extensive experience in microanalysis and its applications to earth and planetary science. He received his PhD in geochemistry at Arizona State University under Peter Buseck and is a former President of the Microbeam Analysis Society.